Beilstein J. Nanotechnol.2019,10, 363–378, doi:10.3762/bjnano.10.36
the price of decreasing the currents, too.
Chargesensing [76][77] is another method to map out the boundaries of the phase diagram, as we illustrate in the right column of Figure 2. A charge sensor is usually engineered to be mostly sensitive to the average electron occupation of one of the quantum
dots, say, QDL. Compared to the conductance measurement through the QD–SC–QD system, chargesensing has the advantage of conceptual simplicity, and the measurability without additional N leads attached to the QD–SC–QD system; but might have the disadvantage of a more complex device design, since the
Figure 2a, the average electron occupation decreases as εL is increased, and the jump locations in follow the phase boundaries. The jumps are more pronounced along the vertical phase boundaries, i.e., in a charge-sensing experiment the measurement of QDL maps out the vertical phase boundary lines more
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Figure 1:
Coherent hybridization between a superconductor and two quantum dots in a Cooper-pair splitter. a) ...
Beilstein J. Nanotechnol.2016,7, 284–295, doi:10.3762/bjnano.7.26
fundamental mode, and phase imaging on the higher eigenmode.
Keywords: atomic force microscopy; chargesensing; feedthrough cancellation; multimode sensor; piezoelectric cantilever; self-sensing; Introduction
Emerging methods in multifrequency atomic force microscopy (MF-AFM) rely on the detection and
principle is used for both actuation and sensing. Recently, the authors proposed two reciprocal self-sensing schemes for tapping-mode atomic force microscopy (TM-AFM) utilizing chargesensing and charge actuation respectively [18][19], using a single piezoelectric layer. The proposed techniques enable the
material.
Block diagram of the self-sensing scheme with dual feedforward compensator to cancel the capacitive feedthrough at two resonances.
Photo of the implemented PCB circuit for bimodal chargesensing.
(a) Frequency response measured with the OBD sensor (−) of an NT-MDT NSG01 base-excited cantilever
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Figure 1:
Simplified cross-section schematic of a beam with bonded piezoelectric layer. An electric field E3 ...